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Normal view MARC view ISBD view

High frequency measurements and noise in electronic circuits

Smith, Douglas C.

High frequency measurements and noise in electronic circuits - New York, N.Y. : Van Nostrand Reinhold, 1993 - 231

Subjects--Topical Terms:
ELECTRONIC CIRCUITS--NOISE
ELECTRONIC CIRCUIT DESIGN
ELECTROMAGNETIC NOISE

LC Class. No.: TK7867.5 / S647H

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