Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].
Material type:
- 9780471731726
- TK7871.99.M44 R444
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TK7871.99 .M44 M377M Modern CMOS circuits manual | TK7871.99 .M44 M377M Modern CMOS circuits manual | TK7871.99.M44 N366 Nanoscale CMOS : innovative materials, modeling and characterization / | TK7871.99.M44 R444 Reliability wearout mechanisms in advanced CMOS technologies / | TK7871.99 .T5 B472T 1997 Thyristor engineering / | TK7871.99 .T5 M67M Motorola Thyristor device data | TK7871.99 .T5 M67M Motorola Thyristor device data |
Includes bibliographical references and index
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