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Applied logistic regression [electronic resource] / David W. Hosmer, Stanley Lemeshow.

By: Contributor(s): Material type: TextTextSeries: Wiley series in probability and statistics. Texts and references sectionPublication details: New York, N.Y. : Wiley-Interscience, c2000.Edition: 2nd edDescription: xii, 373 p. : ill. ; 25 cmISBN:
  • 9780471356325
  • 9780471654025 (electronic bk.)
Subject(s): LOC classification:
  • QA278.2 .H67 2000
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"A Wiley-Interscience publication."

Includes bibliographical references and index.

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