000 01744nam0a22003370a04500
001 000126893
005 20250302054837.0
008 s1989 xxu fnx000 000 0neng d
020 _a0803112734
035 _a2004006001
050 4 _aTK7871.85
_bS454
245 0 0 _aSemiconductor fabrication :
_btechnology and metrology /
_cDinesh C. Gupta, editor
260 _aPhiladelphia, Pa. :
_bASTM,
_c1989
300 _a476 p. :
_bill.
490 0 _aSTP ;
_v990
490 0 _aASTM special technical publication ;
_v990
500 _aPapers originally presented at the Fifth International Symposium on Semiconductor Processing, held at Santa Clara, Calif., on Feb. 1-5, 1988, sponsored by ASTM Committee F-1 on Electronics and Semiconductor Equipment & Materials Institute
500 _a"ASTM publication code number (PCN) 04-990000-46"
504 _aIncludes bibliographies and indexes
650 0 _aSEMICONDUCTORS
_xDESIGN AND CONSTRUCTION
_vCONGRESSES
_995180
700 1 _aGupta, Dinesh C.,
_eed.
_995181
710 2 _aASTM Committee F-1 on Electronics
_995182
710 2 _aSemiconductor Equipment and Materials Institute
_995183
711 2 _aSymposium on Semiconductor Processing
_n(5th :
_d1988 :
_cSanta Clara, Calif.)
_995184
949 _b200406150058
_p1050.00
_nBUR
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990 _aA40064
_bJun 25 2004 9:06AM
991 0 0 _a0900
997 _b00
_cคณะวิศวกรรมศาสตร์ (กราฟวิศวกรรม กลศาสตร์ พลศาสตร์ คณิตศาสตร์วิศวกรรม)
942 _2lcc
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