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| 008 | 140521s2009 njua f 000 0 eng d | ||
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| 050 | 4 |
_aTK7871.99.M44 _bR444 |
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| 245 | 0 | 0 |
_aReliability wearout mechanisms in advanced CMOS technologies / _cAlvin W. Strong ... [et al.]. |
| 260 |
_aHoboken, N.J. : _bIEEE Press, _cc2009. |
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| 300 |
_a624 p. : _bill. |
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| 490 | 1 | _aIEEE Press series on microelectronic systems / Stewart K. Tewksbury and Joe E. Brewer, series editors | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xReliability _9136533 |
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| 700 | 1 |
_aStrong, Alvin Wayne, _d1949- _9136534 |
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_b201106140023 _p5890.00 _nBUR _rSID02 RONO20110549 ORDNO3 _gPC _t10 _c190 _lB |
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| 990 |
_aA54083 _b20141020 |
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_b00 _cคณะวิศวกรรมศาสตร์ (กราฟวิศวกรรม กลศาสตร์ พลศาสตร์ คณิตศาสตร์วิศวกรรม) |
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