000 01045nam a2200277 a 4500
001 252216
003 TH-BaBU
005 20250302081437.0
008 000411s2000 nyua b 001 0 eng d
020 _a9780471356325
020 _a9780471654025 (electronic bk.)
040 _aDLC
_cTH-BaBU
050 0 0 _aQA278.2
_b.H67 2000
100 1 _aHosmer, David W.
_921250
245 1 0 _aApplied logistic regression
_h[electronic resource] /
_cDavid W. Hosmer, Stanley Lemeshow.
250 _a2nd ed.
260 _aNew York, N.Y. :
_bWiley-Interscience,
_cc2000.
300 _axii, 373 p. :
_bill. ;
_c25 cm.
490 0 _aWiley series in probability and statistics.
_pTexts and references section
500 _a"A Wiley-Interscience publication."
504 _aIncludes bibliographical references and index.
650 0 _aRegression analysis.
_917886
700 1 _aLemeshow, Stanley.
_921251
856 4 1 _uhttp://search.ebscohost.com/login.aspx?direct=true&db=nlebk&AN=99027&site=ehost-live&scope=site
_zElectronic Resources
942 _2lcc
_cEB
999 _c252216
_d252216