000 | 01034nam a22002657a 4500 | ||
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001 | 254227 | ||
003 | TH-BaBU | ||
005 | 20250302082452.0 | ||
008 | 050720s2003 enkaf b 001 0 eng d | ||
020 | _a9780415303972 | ||
020 | _a9780203608999 (electronic bk.) | ||
040 |
_aUKM _cTH-BaBU |
||
050 | 0 | 0 |
_aTA417.25 _b.A57 2003 |
245 | 0 | 0 |
_aAnalysis of residual stress by diffraction using neutron and synchrotron radiation _h[electronic resource] / _cedited by M.E. Fitzpatrick and A. Lodini. |
260 |
_aLondon : _bTaylor & Francis, _c2003. |
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300 | _a1 online resource | ||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 |
_aNeutron radiography. _9162042 |
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650 | 0 |
_aSynchrotron radiation. _9156477 |
|
650 | 0 |
_aResidual stresses. _993541 |
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700 | 1 |
_aFitzpatrick, M. E. _q(Michael E.), _eed. _9162043 |
|
700 | 1 |
_aLodini, Alain. _eed. _9162044 |
|
856 | 4 | 1 |
_uhttp://search.ebscohost.com/login.aspx?direct=true&db=nlebk&AN=93341&site=ehost-live&scope=site _zElectronic Resources |
942 |
_2lcc _cEB |
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999 |
_c254227 _d254227 |