000 01034nam a22002657a 4500
001 254227
003 TH-BaBU
005 20250302082452.0
008 050720s2003 enkaf b 001 0 eng d
020 _a9780415303972
020 _a9780203608999 (electronic bk.)
040 _aUKM
_cTH-BaBU
050 0 0 _aTA417.25
_b.A57 2003
245 0 0 _aAnalysis of residual stress by diffraction using neutron and synchrotron radiation
_h[electronic resource] /
_cedited by M.E. Fitzpatrick and A. Lodini.
260 _aLondon :
_bTaylor & Francis,
_c2003.
300 _a1 online resource
504 _aIncludes bibliographical references and index.
650 0 _aNeutron radiography.
_9162042
650 0 _aSynchrotron radiation.
_9156477
650 0 _aResidual stresses.
_993541
700 1 _aFitzpatrick, M. E.
_q(Michael E.),
_eed.
_9162043
700 1 _aLodini, Alain.
_eed.
_9162044
856 4 1 _uhttp://search.ebscohost.com/login.aspx?direct=true&db=nlebk&AN=93341&site=ehost-live&scope=site
_zElectronic Resources
942 _2lcc
_cEB
999 _c254227
_d254227